The AT Synchro/Resolver series of products provide fully independent Synchro/Resolver-to-Digital and fully independent Digital-to-Synchro/Resolver channels which are available on 6U VME64x module. Each channel is implemented using DDC converters. A common on-board oscillator eliminates the need for an external reference oscillator. Transformer isolation is available on-board for measurement channels while it is optional for simulation channels.

The card is available in various combinations. Up to 2 measurement (Synchro/Resolver-to-Digital) Channels and 6 simulation (Digital-to-Synchro/Resolver) Channels can be configured. The S/R-D products can be used as Synchro/Resolver simulator to test the equipment, which has Synchro/Resolver interface in it. The D/S-R products can be used for angular measurement applications.

The card is capable of accommodating most military voltages; e.g., 11.8, or 90 Vrms @ 400 Hz. This architecture allows for minimum board count to achieve the maximum functionality in systems that require precision positioning, control and stabilization. Each input channel of S/R-D is independent and can be configured as either a Synchro or Resolver input using on-board jumpers. Each output channel of D-S/R is independent and can be configured as either a Synchro or Resolver output using on-board jumpers.

The AT-VME-SRC card comes with a Virtual Instrument Panel providing interactive control of Synchro/Resolver features. The control interface appears on the computer display & user manipulates these controls with a mouse/trackball or keyboard. The purpose of Virtual Instrument Panel is to help the user (mostly system integrators) to quickly setup & use the card, just like a stand-alone instrument with physical front-end knobs, controls & display without getting into programming intricacies.

The AT-VME-SRC card comes with a powerful set of library functions to access the Synchro/Resolver functionality. The drivers are designed in a modular fashion consisting of component functions & application functions. The users test program can be developed with a few calls to the card driver, by using the set of application functions provided. Drivers and high-level API libraries for Windows 2000/XP, Linux, RT-Linux is are available.